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Cambridge, United Kingdom

Teraview Limited

USPTO Granted Patents = 43

EPO Patents = 6

Trademarks = 1

Forward Citations = 465

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29 inventors (with patents filed for the assignee):

Bryan Edward Cole (21 out of 21 patents)

Donald Dominic Arnone (12 out of 14 patents)

Craig Michael Ciesla (9 out of 10 patents)

4. Ian Stephen Gregory (5 out of 5 patents)

5. Julian Alexander Cluff (5 out of 5 patents)

6. Philip Francis Taday (5 out of 5 patents)

7. Simon Chandler (4 out of 4 patents)

8. Michael John Evans (4 out of 4 patents)

9. William R Tribe (4 out of 4 patents)

10. Robert May (3 out of 3 patents)

11. Daniel James Farrell (3 out of 3 patents)

12. Vincent Patrick Wallace (3 out of 3 patents)

13. Michael John Withers (3 out of 4 patents)

14. Anthony J Fitzgerald (2 out of 2 patents)

15. Darius M Sullivan (2 out of 14 patents)

Core Competencies:

Terahertz Imaging

Coating Thickness Measurement

Radiation Feedback Control

TeraHertz Probe Array

Scanning Terahertz Probe

Spectroscopy Techniques

Non-Planar Sample Investigation

Imaging Techniques

Electrodes on Photoconductive Substrate

Magnetically Enhanced Radiation Source

Quantitative Analysis with Terahertz Radiation

Three Dimensional Imaging

43 patents: Sort by Forward Citations

1. 12392820 - Test system with adjustable delay line and radiation feedback control (2025-08-19),

2. 12332297 - Test system (2025-06-17),

3. 12298118 - Method and system for measuring coating thickness (2025-05-13),

4. 11921154 - Test system (2024-03-05),

5. 11885610 - Method and system for measuring coating thickness (2024-01-30),

6. 11726136 - Test system (2023-08-15),

7. 11366158 - Test system for testing the integrity of an electronic device (2022-06-21),

8. 11169202 - Test system (2021-11-09),

9. 11085755 - Method and system for measuring coating thickness (2021-08-10),

10. 10845411 - Transmission line (2020-11-24),

11. 10076261 - Imaging apparatus and method (2018-09-18),

12. 10006960 - Test system (2018-06-26),

13. 9829433 - Imaging techniques and associated apparatus (2017-11-28),

14. 9201052 - Analysis apparatus and method (2015-12-01),

15. 9075002 - TeraHertz probe array imaging system (2015-07-07),

TeraView Limited is a leading provider of terahertz spectroscopy solutions. With over 20 years of experience, TeraView specializes in developing and manufacturing advanced terahertz measurement and imaging systems. Their innovative technology enables customers to non-destructively analyze and visualize the properties of a wide range of materials in various industries, including pharmaceuticals, semiconductors, security, and more. TeraView's solutions are used for quality control, research, and development purposes, helping businesses improve their manufacturing processes, detect defects, and optimize performance. With a team of experts and a strong commitment to innovation, TeraView continues to push the boundaries of terahertz technology and provide cutting-edge solutions to their global customer base.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

43 Patents

#23 in Cambridge

#392 in United Kingdom

#15,579 in the World

Cambridge, United Kingdom

Teraview Limited

Forward Citations = 465

29 inventors:

Bryan Edward Cole (21 out of 21 patents)

Donald Dominic Arnone (12 out of 14 patents)

Craig Michael Ciesla (9 out of 10 patents)

4. Ian Stephen Gregory (5 out of 5 patents)

5. Julian Alexander Cluff (5 out of 5 patents)

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