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For the Inventor, By the Inventor

Cambridge, United Kingdom

Teraview Limited


USPTO Granted Patents = 43

% Expired Patents = 20.9


Forward Citations = 472

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29 inventors (with patents filed for the assignee):

goldMedal Bryan Edward Cole (21 out of 21 patents)

silverMedal Donald Dominic Arnone (12 out of 14 patents)

bronzeMedal Craig Michael Ciesla (9 out of 10 patents)

4.  Ian Stephen Gregory (5 out of 5 patents)

5.  Julian Alexander Cluff (5 out of 5 patents)

6.  Philip Francis Taday (5 out of 5 patents)

7.  Simon Chandler (4 out of 5 patents)

8.  Michael John Evans (4 out of 4 patents)

9.  William R Tribe (4 out of 4 patents)

10.  Robert May (3 out of 3 patents)

11.  Daniel James Farrell (3 out of 3 patents)

12.  Vincent Patrick Wallace (3 out of 3 patents)

13.  Michael John Withers (3 out of 4 patents)

14.  Anthony J Fitzgerald (2 out of 2 patents)

15.  Darius M Sullivan (2 out of 14 patents)


Core Competencies:
Terahertz
Imaging
Coating Thickness
Test System
Radiation Probe
Spectroscopy
Probe Array
Sample Investigation
Electrodes
Scanning
Quantum Analysis
Three Dimensional Imaging

43 patents:

1. 12392820 - Test system with adjustable delay line and radiation feedback control (2025-08-19),
2. 12332297 - Test system (2025-06-17),
3. 12298118 - Method and system for measuring coating thickness (2025-05-13),
4. 11921154 - Test system (2024-03-05),
5. 11885610 - Method and system for measuring coating thickness (2024-01-30),
6. 11726136 - Test system (2023-08-15),
7. 11366158 - Test system for testing the integrity of an electronic device (2022-06-21),
8. 11169202 - Test system (2021-11-09),
9. 11085755 - Method and system for measuring coating thickness (2021-08-10),
10. 10845411 - Transmission line (2020-11-24),
11. 10076261 - Imaging apparatus and method (2018-09-18),
12. 10006960 - Test system (2018-06-26),
13. 9829433 - Imaging techniques and associated apparatus (2017-11-28),
14. 9201052 - Analysis apparatus and method (2015-12-01),
15. 9075002 - TeraHertz probe array imaging system (2015-07-07),
Teraview Limited, based in Cambridge, GB, specializes in advanced terahertz imaging technologies. The company focuses on developing innovative solutions for coating thickness measurement, radiation feedback control, and spectroscopy techniques. Its expertise extends to non-planar sample investigation and the use of scanning terahertz probes, enabling high-resolution imaging and analysis across various applications. Teraview's commitment to research and development positions it at the forefront of terahertz technology, catering to diverse industrial and scientific needs.
Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Sep 29 2026

Teraview Limited
43 Patents

#23 in Cambridge

#404 in United Kingdom

#16,010 in the World

Cambridge, GB
Cambridge, United Kingdom

Teraview Limited

Forward Citations = 472

29 inventors:

goldMedal Bryan Edward Cole (21 out of 21 patents)

silverMedal Donald Dominic Arnone (12 out of 14 patents)

bronzeMedal Craig Michael Ciesla (9 out of 10 patents)

4.  Ian Stephen Gregory (5 out of 5 patents)

5.  Julian Alexander Cluff (5 out of 5 patents)

Please report any incorrect information to [email protected]
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