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USPTO Data Jan 1 1976 - Nov 10 2026
43 Patents
#23 in Cambridge
#406 in United Kingdom
#16,068 in the World
Teraview Limited
Forward Citations = 475
30 inventors:
Teraview Limited
Calculating rank
% Expired Patents = 20.9
EPO Patents = 7
Forward Citations = 475
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30 inventors (with patents filed for the assignee):
Bryan Edward Cole (21 out of 21 patents)
Donald Dominic Arnone (12 out of 14 patents)
Craig Michael Ciesla (9 out of 10 patents)
4. Ian Stephen Gregory (5 out of 5 patents)
5. Julian Alexander Cluff (5 out of 5 patents)
6. Philip Francis Taday (5 out of 5 patents)
7. Simon Chandler (4 out of 5 patents)
8. Michael John Evans (4 out of 4 patents)
9. William R Tribe (4 out of 4 patents)
10. Robert May (3 out of 3 patents)
11. Daniel James Farrell (3 out of 3 patents)
12. Vincent Patrick Wallace (3 out of 3 patents)
13. Michael John Withers (3 out of 4 patents)
14. Anthony J Fitzgerald (2 out of 2 patents)
15. Darius M Sullivan (2 out of 14 patents)
Core Competencies:
Terahertz
Imaging
Coating Thickness
Test System
Radiation Probe
Spectroscopy
Probe Array
Sample Investigation
Electrodes
Scanning
Quantum Analysis
Three Dimensional Imaging
43 patents:
Company Overview
Teraview Limited, based in Cambridge, GB, specializes in advanced terahertz imaging technologies. The company focuses on developing innovative solutions for coating thickness measurement, radiation feedback control, and spectroscopy techniques. Its expertise extends to non-planar sample investigation and the use of scanning terahertz probes, enabling high-resolution imaging and analysis across various applications. Teraview's commitment to research and development positions it at the forefront of terahertz technology, catering to diverse industrial and scientific needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Teraview Limited. Retrieved from https://idiyas.com/company/teraview
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
7 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]