Company Filing History:
Years Active: 2021-2025
Title: The Innovations of Daniel James Farrell
Introduction
Daniel James Farrell is a notable inventor based in Cambridge, GB. He has made significant contributions to the field of coating measurement technology. With a total of 3 patents to his name, Farrell's work is recognized for its innovative approach to determining coating thickness.
Latest Patents
One of Farrell's latest patents is a method and system for measuring coating thickness. This method involves performing a calibration analysis on calibration data to determine initial values and search limits of optical parameters of multiple coating layers. The process includes irradiating these layers with a pulse of THz radiation ranging from 0.01 THz to 10 THz. It also entails detecting the reflected radiation to produce a sample response, producing a synthesized waveform using the optical parameters and predetermined initial thicknesses of the layers, and varying the thicknesses and optical parameters to minimize the error between the sample response and the synthesized waveform. Ultimately, this method outputs the thicknesses of the layers.
Career Highlights
Daniel James Farrell is currently associated with Teraview Limited, where he continues to develop innovative solutions in his field. His work has garnered attention for its practical applications and technological advancements.
Collaborations
Farrell has collaborated with notable colleagues, including Ian Stephen Gregory and Robert May. Their combined expertise contributes to the innovative projects at Teraview Limited.
Conclusion
Daniel James Farrell's contributions to the field of coating measurement technology exemplify the spirit of innovation. His patents and collaborative efforts continue to push the boundaries of what is possible in this area.