The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Dec. 16, 2016
Applicant:

Teraview Limited, Cambridge, GB;

Inventors:

Bryan Edward Cole, Cambridge, GB;

Darius Sullivan, Cambridge, GB;

Simon Chandler, Cambridge, GB;

Assignee:

TeraView Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/073 (2006.01); G01R 31/00 (2006.01); G01R 31/308 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2887 (2013.01); G01R 31/308 (2013.01); G01R 35/005 (2013.01);
Abstract

A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.


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