The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Mar. 05, 2001
Applicants:
Donald Dominic Arnone, Cambridge, GB;
Bryan Edward Cole, Cambridge, GB;
Craig Michael Ciesla, Cambridge, GB;
Inventors:
Donald Dominic Arnone, Cambridge, GB;
Bryan Edward Cole, Cambridge, GB;
Craig Michael Ciesla, Cambridge, GB;
Assignee:
TeraView Limited, Cambridge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/31 (2006.01); A61B 5/05 (2006.01); A61B 5/00 (2006.01); G01N 21/3581 (2014.01); G01N 21/47 (2006.01); G01N 21/43 (2006.01);
U.S. Cl.
CPC ...
A61B 5/05 (2013.01); A61B 5/0507 (2013.01); A61B 5/4547 (2013.01); G01N 21/3581 (2013.01); G01N 21/4795 (2013.01); G01N 21/43 (2013.01);
Abstract
A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.