The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Feb. 11, 2005
Applicants:
Bryan E. Cole, Cambridge, GB;
Simon J. Chandler, Cambridge, GB;
Inventors:
Bryan E. Cole, Cambridge, GB;
Simon J. Chandler, Cambridge, GB;
Assignee:
TeraView Limited, Cambridge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/49 (2006.01); G01N 21/3581 (2014.01); G01N 21/47 (2006.01); G01N 21/3563 (2014.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01N 21/3563 (2013.01); G01N 21/474 (2013.01); G01N 21/49 (2013.01); G01N 2021/1772 (2013.01); G01N 2201/0853 (2013.01);
Abstract
A probe array () for an imaging system for examining an object () comprising at least one emitter () for emitting radiation, a plurality of detectors () for detecting radiation and means for directing radiation emitted by the at least one emitter () to the object () and for directing radiation reflected from the object () to at least two of the plurality of detectors () wherein in use the emitted radiation is scanned by means () across the object ().