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Waltham, MA, United States of America

Olympus Ndt

USPTO Granted Patents = 64

CIPO Patents = 4

EPO Patents = 10

Forward Citations = 188

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50 inventors (with patents filed for the assignee):

Andrew Thomas (16 out of 22 patents)

Benoit Lepage (14 out of 46 patents)

Michael Drummy (13 out of 13 patents)

4. Jinchi Zhang (5 out of 16 patents)

5. Jason Habermehl (5 out of 11 patents)

6. Pierre Langlois (5 out of 7 patents)

7. Steven Besser (5 out of 7 patents)

8. Paul Joseph DeAngelo (5 out of 6 patents)

9. Steven Abe LaBreck (4 out of 5 patents)

10. Tommy Bourgelas (3 out of 4 patents)

11. Christophe Claude Imbert (3 out of 4 patents)

12. Jason Toomey (3 out of 3 patents)

13. Ronald Scott Collicutt (2 out of 5 patents)

14. Denis Faucher (2 out of 4 patents)

15. Matthew Edward Stanton (2 out of 4 patents)

Core Competencies:

Phased Array Inspection

Non-Destructive Testing

Eddy Current Inspection

X-Ray Fluorescence

Ultrasonic Inspection

Calibration Techniques

Multi-Sensor Technologies

Acoustic Probes

Material Inspection

Dynamic Range Detection

Wearable Probe Technology

Real-Time Measurement Systems

64 patents: Sort by Forward Citations

1. 9476859 - Automatic calibration for phased array inspection of girth weld (2016-10-25),

2. 9453823 - Apparatus for and a method of improved timing control for non-destructive testing and inspection (2016-09-27),

3. 9350985 - Method and circuitry for removing circling drifts in NDT/NDI measurement display (2016-05-24),

4. 9316618 - Method for monitoring the integrity of an eddy current inspection channel (2016-04-19),

5. 9279786 - Method of and an apparatus conducting calibration for phased-array shear wave channels inspecting square bars (2016-03-08),

6. 9279785 - Monitoring temperature variation in wedge of phased-array probe for weld inspection (2016-03-08),

7. 9244027 - Method and instrument for identifying jewelry with plated element using x-ray florescence (2016-01-26),

8. 9243883 - Apparatus and method for conducting and real-time application of EC probe calibration (2016-01-26),

9. 9182363 - Instrument and method of measuring the concentration of a target element in a multi-layer thin coating (2015-11-10),

10. 9182212 - Hall effect probe with exchangeable wear tips (2015-11-10),

11. 9176080 - X-ray analysis apparatus with detector window protection feature (2015-11-03),

12. 9110036 - Assembly with a universal manipulator for inspecting dovetail of different sizes (2015-08-18),

13. 9032802 - Phased array system and method for inspecting helical submerged arcs weld (HSAW) (2015-05-19),

14. 8913006 - Reciprocal interface panels suitable for multi-purpose actuators (2014-12-16),

15. 8904872 - Detection of channel saturation in phase-array ultrasonic non-destructive testing (2014-12-09),

OLYMPUS NDT, a subsidiary of Olympus Corporation, is a leading manufacturer of nondestructive testing instruments used in industries such as aerospace, automotive, and oil & gas. With a strong focus on research and development, OLYMPUS NDT offers a wide range of advanced inspection solutions including ultrasonic testing, phased array systems, eddy current testing, and X-ray fluorescence analyzers. These cutting-edge technologies enable companies to detect defects, measure material thickness, analyze compositions, and ensure the quality and reliability of their products. With a global presence, OLYMPUS NDT is committed to providing innovative solutions that meet the evolving needs of various industries.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

64 Patents

#17 in Waltham, MA

#308 in Massachusetts

#5,441 in US

#11,009 in the World

Waltham, MA, United States of America

Olympus Ndt

Forward Citations = 188

50 inventors:

Andrew Thomas (16 out of 22 patents)

Benoit Lepage (14 out of 46 patents)

Michael Drummy (13 out of 13 patents)

4. Jinchi Zhang (5 out of 16 patents)

5. Jason Habermehl (5 out of 11 patents)

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