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Waltham, MA, United States of America

Olympus Ndt

USPTO Granted Patents = 64

% Expired Patents = 14.1

EPO Patents = 10

Forward Citations = 192

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46 inventors (with patents filed for the assignee):

Andrew Thomas (16 out of 22 patents)

Benoit Lepage (14 out of 49 patents)

Michael Drummy (13 out of 13 patents)

4. Jinchi Zhang (5 out of 16 patents)

5. Jason Habermehl (5 out of 11 patents)

6. Pierre Langlois (5 out of 7 patents)

7. Steven Besser (5 out of 7 patents)

8. Paul Joseph DeAngelo (5 out of 6 patents)

9. Steven Abe LaBreck (4 out of 5 patents)

10. Tommy Bourgelas (3 out of 4 patents)

11. Christophe Claude Imbert (3 out of 4 patents)

12. Jason Toomey (3 out of 3 patents)

13. Ronald Scott Collicutt (2 out of 5 patents)

14. Denis Faucher (2 out of 4 patents)

15. Matthew Edward Stanton (2 out of 4 patents)

Core Competencies:

Phased Array Inspection

Eddy Current Probes

Ultrasonic Fault Detection

Calibration Methods

NDT/NDI Instruments

X-ray Analysis

Temperature Monitoring

Multi-frequency Bond Testing

Real-time Application

Flexible Array Probes

Acoustic V-path Correction

High Dynamic Range

64 patents: Sort by Forward Citations

1. 9476859 - Automatic calibration for phased array inspection of girth weld (2016-10-25),

2. 9453823 - Apparatus for and a method of improved timing control for non-destructive testing and inspection (2016-09-27),

3. 9350985 - Method and circuitry for removing circling drifts in NDT/NDI measurement display (2016-05-24),

4. 9316618 - Method for monitoring the integrity of an eddy current inspection channel (2016-04-19),

5. 9279786 - Method of and an apparatus conducting calibration for phased-array shear wave channels inspecting square bars (2016-03-08),

6. 9279785 - Monitoring temperature variation in wedge of phased-array probe for weld inspection (2016-03-08),

7. 9244027 - Method and instrument for identifying jewelry with plated element using x-ray florescence (2016-01-26),

8. 9243883 - Apparatus and method for conducting and real-time application of EC probe calibration (2016-01-26),

9. 9182363 - Instrument and method of measuring the concentration of a target element in a multi-layer thin coating (2015-11-10),

10. 9182212 - Hall effect probe with exchangeable wear tips (2015-11-10),

11. 9176080 - X-ray analysis apparatus with detector window protection feature (2015-11-03),

12. 9110036 - Assembly with a universal manipulator for inspecting dovetail of different sizes (2015-08-18),

13. 9032802 - Phased array system and method for inspecting helical submerged arcs weld (HSAW) (2015-05-19),

14. 8913006 - Reciprocal interface panels suitable for multi-purpose actuators (2014-12-16),

15. 8904872 - Detection of channel saturation in phase-array ultrasonic non-destructive testing (2014-12-09),

Company Overview

Olympus NDT, headquartered in Waltham, MA, specializes in non-destructive testing technologies that ensure the integrity and safety of materials and structures. The company develops advanced solutions in phased array inspection, eddy current probes, and ultrasonic fault detection, catering to diverse industries. Their expertise extends to calibration methods, NDT/NDI instruments, X-ray analysis, temperature monitoring, and multi-frequency bond testing, positioning them as a leader in the field of inspection and testing technologies.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

64 Patents

#26 in Waltham, MA

#322 in Massachusetts

#5,686 in US

#11,484 in the World

Waltham, MA, United States of America

Olympus Ndt

Forward Citations = 192

46 inventors:

Andrew Thomas (16 out of 22 patents)

Benoit Lepage (14 out of 49 patents)

Michael Drummy (13 out of 13 patents)

4. Jinchi Zhang (5 out of 16 patents)

5. Jason Habermehl (5 out of 11 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Olympus Ndt. Retrieved from https://idiyas.com/company/olympus-ndt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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