The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Feb. 01, 2012
Applicants:

Paul Joseph Deangelo, Bridgewater, MA (US);

Coleman Mccourt Flanagan, Marlborough, MA (US);

Inventors:

Paul Joseph DeAngelo, Bridgewater, MA (US);

Coleman McCourt Flanagan, Marlborough, MA (US);

Assignee:

Olympus NDT, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06F 3/02 (2006.01); G06F 9/445 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0227 (2013.01); G06F 9/445 (2013.01); G06F 9/4443 (2013.01);
Abstract

A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.


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