The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

May. 31, 2013
Applicant:

Jinchi Zhang, Québec, CA;

Inventor:

Jinchi Zhang, Québec, CA;

Assignee:

OLYMPUS NDT, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01); G01N 29/04 (2006.01); G01N 29/26 (2006.01); G01N 29/28 (2006.01); G01N 29/32 (2006.01);
U.S. Cl.
CPC ...
G01N 29/07 (2013.01); G01N 29/262 (2013.01); G01N 29/28 (2013.01); G01N 29/326 (2013.01); G01N 2291/017 (2013.01); G01N 2291/2675 (2013.01);
Abstract

A coupling wedge for use with a ultrasonic phased array inspection system has a body with a bottom side configured to face the object to be tested and a front side generally oriented at an angle to the bottom side and a top side to be coupled with a phased array probe. The probe includes a plurality of apertures. The front side of the wedge has grooves formed with a plurality of reflectors that are positioned on the front side of the wedge, leaving a distance from the bottom side. The change in TOF values from the reflector to a specific aperture enable the determination of the temperature change in the wedge. An alarm to an operator or alternation of focal laws in the system for temperature compensation can be applied.


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