The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Nov. 14, 2013
Applicant:

Xunming Chen, Bedford, MA (US);

Inventor:

Xunming Chen, Bedford, MA (US);

Assignee:

OLYMPUS NDT, INC., Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 2223/076 (2013.01); G01N 2223/61 (2013.01); G01N 2223/633 (2013.01);
Abstract

An instrument and a method of detecting a target element in a multi-layer thin coating. Lα, Lβ and Lγ x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using Lα and Lβ intensities once, and then using the Lβ and Lγ intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.


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