The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Jul. 17, 2012
Michael Drummy, North Reading, MA (US);
Michael Drummy, North Reading, MA (US);
Olympus NDT, Inc., Waltham, MA (US);
Abstract
An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.