Enter assignee name

% Expired Patents = 5.9

Forward Citations = 92

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6 inventors (with patents filed for the assignee):

Christopher Su-Yan Own (17 out of 18 patents)

Matthew Francis Murfitt (7 out of 8 patents)

William Andregg (5 out of 7 patents)

4. Andrew Bleloch (5 out of 5 patents)

5. Paul Dabrowski (2 out of 7 patents)

6. Michael Andregg (2 out of 3 patents)

17 patents: Sort by Forward Citations

1. 12620548 - Transmission electron microscopy (2026-05-05),

2. 12397313 - Coating of samples for microscopy (2025-08-26),

3. 12094684 - Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy (2024-09-17),

4. 11850620 - Coating of samples for microscopy (2023-12-26),

5. 11404243 - Microscopy (2022-08-02),

6. 11398365 - Positioning samples for microscopy, inspection, or analysis (2022-07-26),

7. 10847343 - Microscopy (2020-11-24),

8. 9997331 - Charged-particle beam microscopy (2018-06-12),

9. 9899186 - Charged-particle beam microscope with an evaporator (2018-02-20),

10. 9564291 - Hybrid charged-particle beam and light beam microscopy (2017-02-07),

11. 8927932 - Scanning transmission electron microscopy for imaging extended areas (2015-01-06),

12. 8921787 - Incoherent transmission electron microscopy (2014-12-30),

13. 8748818 - Incoherent transmission electron microscopy (2014-06-10),

14. 8598527 - Scanning transmission electron microscopy (2013-12-03),

15. 8569694 - Aberration-correcting dark-field electron microscopy (2013-10-29),

Mochii, Inc. is a technology company based in Seattle, WA, specializing in innovative solutions that enhance user experiences through advanced software development. The organization focuses on creating applications that leverage cutting-edge technologies, including artificial intelligence and machine learning, to address complex challenges across various industries. With a commitment to research and development, Mochii aims to drive progress in digital transformation and improve operational efficiencies for its clients.

Profile summary based on public USPTO records.