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Forward Citations = 88

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6 inventors (with patents filed for the assignee):

Christopher Su-Yan Own (16 out of 17 patents)

Matthew Francis Murfitt (6 out of 7 patents)

William Andregg (5 out of 7 patents)

4. Andrew Bleloch (5 out of 5 patents)

5. Paul Dabrowski (2 out of 7 patents)

6. Michael Andregg (2 out of 3 patents)

16 patents: Sort by Forward Citations

1. 12397313 - Coating of samples for microscopy (2025-08-26),

2. 12094684 - Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy (2024-09-17),

3. 11850620 - Coating of samples for microscopy (2023-12-26),

4. 11404243 - Microscopy (2022-08-02),

5. 11398365 - Positioning samples for microscopy, inspection, or analysis (2022-07-26),

6. 10847343 - Microscopy (2020-11-24),

7. 9997331 - Charged-particle beam microscopy (2018-06-12),

8. 9899186 - Charged-particle beam microscope with an evaporator (2018-02-20),

9. 9564291 - Hybrid charged-particle beam and light beam microscopy (2017-02-07),

10. 8927932 - Scanning transmission electron microscopy for imaging extended areas (2015-01-06),

11. 8921787 - Incoherent transmission electron microscopy (2014-12-30),

12. 8748818 - Incoherent transmission electron microscopy (2014-06-10),

13. 8598527 - Scanning transmission electron microscopy (2013-12-03),

14. 8569694 - Aberration-correcting dark-field electron microscopy (2013-10-29),

15. 8389937 - Incoherent transmission electron microscopy (2013-03-05),

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