% Expired Patents = 20.0

Forward Citations = 36

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10 inventors (with patents filed for the assignee):

Norimichi Anazawa (3 out of 4 patents)

Jun Nitta (2 out of 43 patents)

Izumi Santo (1 out of 1 patent)

4. Masashi Ataka (1 out of 1 patent)

5. Hitomi Sato (1 out of 1 patent)

6. Katuyuki Takahashi (1 out of 1 patent)

7. Akira Yonezawa (1 out of 18 patents)

8. Tatenori Jinriki (1 out of 1 patent)

9. Ryuichi Shimizu (1 out of 1 patent)

10. Minoru Ito (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 10553391 - SEM image acquisition device and SEM image acquisition method (2020-02-04),

2. 7519942 - Pattern specification method and pattern specification apparatus (2009-04-14),

3. 7409309 - Method of deciding the quality of the measurement value by the edge width (2008-08-05),

4. 7375328 - Charged particle beam apparatus and contamination removal method therefor (2008-05-20),

5. 6686591 - Apparatus for inspecting mask (2004-02-03),

Company Overview

Holon Co., Ltd. is a leading technology company specializing in cutting-edge solutions for the healthcare industry. With a focus on innovation and quality, Holon provides advanced medical devices and software to improve patient care and streamline operations for healthcare providers. Their products are known for their reliability, efficiency, and user-friendly interface.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

5 Patents

#110 in Saitama 343-0827

#6,652 in Japan

Saitama, Japan

Holon Co., Ltd.

Forward Citations = 36

10 inventors:

Norimichi Anazawa (3 out of 4 patents)

Jun Nitta (2 out of 43 patents)

Izumi Santo (1 out of 1 patent)

4. Masashi Ataka (1 out of 1 patent)

5. Hitomi Sato (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Holon Co., Ltd.. Retrieved from https://idiyas.com/company/holon-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]