For the Inventor, By the Inventor

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Santa Barbara, CA, United States of America

Digital Instruments

USPTO Granted Patents = 40

Trademarks = 3

Forward Citations = 1,752

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25 inventors (with patents filed for the assignee):

Virgil B Elings (37 out of 51 patents)

John A Gurley (25 out of 25 patents)

David A Grigg (5 out of 11 patents)

4. Craig B Prater (5 out of 6 patents)

5. James Massie (4 out of 13 patents)

6. Paul K Hansma (4 out of 29 patents)

7. Barney Drake (4 out of 10 patents)

8. Peter Maivald (3 out of 3 patents)

9. Charles R Meyer (2 out of 4 patents)

10. Dror Sarid (2 out of 3 patents)

11. Kevin Kjoller (1 out of 33 patents)

12. Allen J Bard (1 out of 47 patents)

13. Jason Paul Cleveland (1 out of 53 patents)

14. Fu-Ren F Fan (1 out of 10 patents)

15. Boris Anczykowski (1 out of 2 patents)

Core Competencies:

Scanning Probe Microscopes

Atomic Force Microscopes

Feedback Control

Energy Dissipation Measurement

Mechanical Properties Measurement

Vertical Metrology

Drift Compensation

Tapping Mode Microscopy

Cantilever Tracking

Compact Microscopes

Automatic Probe Exchange

Electrochemical Microscopy

40 patents: Sort by Forward Citations

1. RE37203 - Feedback control for scanning tunnel microscopes (2001-06-05),

2. 6038916 - Method and apparatus for measuring energy dissipation by a probe during (2000-03-21),

3. 6032518 - Scanning stylus atomic force microscope with cantilever tracking and (2000-03-07),

4. 6008489 - Method for improving the operation of oscillating mode atomic force (1999-12-28),

5. 5898106 - Method and apparatus for obtaining improved vertical metrology (1999-04-27),

6. 5866807 - Method and apparatus for measuring mechanical properties on a small scale (1999-02-02),

7. 5714682 - Scanning stylus atomic force microscope with cantilever tracking and (1998-02-03),

8. 5705814 - Scanning probe microscope having automatic probe exchange and alignment (1998-01-06),

9. 5560244 - Scanning stylus atomic force microscope with cantilever tracking and (1996-10-01),

10. 5557156 - Scan control for scanning probe microscopes (1996-09-17),

11. 5553487 - Methods of operating atomic force microscopes to measure friction (1996-09-10),

12. 5519212 - Tapping atomic force microscope with phase or frequency detection (1996-05-21),

13. 5463897 - Scanning stylus atomic force microscope with cantilever tracking and (1995-11-07),

14. 5418363 - Scanning probe microscope using stored data for vertical probe (1995-05-23),

15. 5415027 - Jumping probe microscope (1995-05-16),

Digital Instruments is a leading technology company specializing in the development and production of advanced instruments and equipment for various industries. With a focus on innovation and quality, we provide cutting-edge solutions that enable our customers to achieve their goals more efficiently. Our comprehensive product portfolio includes precision measurement tools, data loggers, environmental sensors, and laboratory equipment. We strive to deliver reliable and user-friendly devices that meet the highest industry standards. To learn more about our products and services, please visit our website.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

40 Patents

#7 in Santa Barbara, CA

#1,976 in California

#8,342 in US

#16,561 in the World

Santa Barbara, CA, United States of America

Digital Instruments

Forward Citations = 1,752

25 inventors:

Virgil B Elings (37 out of 51 patents)

John A Gurley (25 out of 25 patents)

David A Grigg (5 out of 11 patents)

4. Craig B Prater (5 out of 6 patents)

5. James Massie (4 out of 13 patents)

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