Location History:
- Tucson, A (1991)
- Tucson, AZ (US) (1993 - 1999)
Company Filing History:
2 out of 40 
1 out of 832,843 Years Active: 1991-1999
Title: Dror Sarid: Innovator in Atomic Force Microscopy
Introduction
Dror Sarid is a prominent inventor based in Tucson, Arizona, known for his significant contributions to the field of atomic force microscopy. With a total of three patents to his name, Sarid has made remarkable advancements in measuring properties of dielectric materials.
Latest Patents
One of Dror Sarid's latest patents is an atomic force microscope designed for measuring properties of dielectric materials. This innovative device features an electrically-conductive probe and tip, equipped with a feedback control circuit that generates a consistent Fowler-Nordheim current between the probe tip and the surface of an electrically-conductive sample. The feedback circuit effectively maintains the desired current flow by adjusting the bias voltage applied to the probe tip, allowing for precise measurements of the thickness and electrical properties of thin dielectric films.
Another notable patent is the compact atomic force microscope, which integrates the sensor into a very small structure. This microscope utilizes optical interference and can operate in both contact and non-contact modes, enabling high-resolution measurements as well as the ability to assess electric and magnetic fields. One configuration allows the microscope to be placed on or suspended above large samples, facilitating the scanning of small local areas.
Career Highlights
Throughout his career, Dror Sarid has worked with various companies, including Digital Instruments, where he honed his skills and contributed to the development of advanced microscopy technologies. His work has significantly impacted the field, leading to enhanced measurement techniques and improved understanding of material properties.
Collaborations
Dror Sarid has collaborated with notable individuals in the field, including Virgil B. Elings and John A. Gurley. These collaborations have further enriched his research and development efforts, fostering innovation in atomic force microscopy.
Conclusion
Dror Sarid's contributions to atomic force microscopy exemplify his dedication to advancing scientific knowledge and technology. His innovative patents and collaborations have positioned him as a key figure in the field, paving the way for future advancements in material measurement techniques.