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For the Inventor, By the Inventor

Santa Barbara, CA, United States of America

Virgil B Elings

This inventor holds 51 USPTO granted patents, primarily in Atomic Force Microscopy (CPC class 2503). Top assignees: Digital Instruments, University of California, Veeco Instruments Inc.. Active years: 1977-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Virgil B Elings. Retrieved from https://idiyas.com/inventor/virgil-b-elings

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 51

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 31

Forward Citations = 2,389(Granted Patents)

Forward Citations (Not Self Cited) = 2,286(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Goleta, CA (US) (1977)
  • Santa Barbara, CA (US) (1980 - 2012)

Company Filing History:

goldMedal37 out of 40 
 
Digital Instruments
 patents
silverMedal5 out of 16,025 
 
University of California
 patents
bronzeMedal2 out of 312 
 
Veeco Instruments Inc.
 patents
4. 1 out of 169 
 
Bruker Nano Gmbh
 patents
5. 9 out of 834,513 
Other
 patents
where one patent can have more than one assignee

Years Active: 1977-2012

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Areas of Expertise:
Atomic Force Microscope
Scanning Probe Microscope
Cantilever Tracking
Optical Access
Feedback Control
Mechanical Properties
Vertical Metrology
Tapping Mode
Drift Compensation
Sample Area Scanning
Friction Measurement
Piezoelectric Scanner
51 patents (USPTO):Explore Patents
1. 8087288 - Scanning stylus atomic force microscope with cantilever tracking and optical access (2012-01-03),
2. 6642517 - Method and apparatus for atomic force microscopy (2003-11-04),
3. RE37203 - Feedback control for scanning tunnel microscopes (2001-06-05),
4. 6172506 - Capacitance atomic force microscopes and methods of operating such microscopes (2001-01-09),
5. 6032518 - Scanning stylus atomic force microscope with cantilever tracking and (2000-03-07),
6. 6008489 - Method for improving the operation of oscillating mode atomic force (1999-12-28),
7. 5939709 - Scanning probe optical microscope using a solid immersion lens (1999-08-17),
8. 5898106 - Method and apparatus for obtaining improved vertical metrology (1999-04-27),
9. 5874734 - Atomic force microscope for measuring properties of dielectric and (1999-02-23),
10. 5866807 - Method and apparatus for measuring mechanical properties on a small scale (1999-02-02),
11. 5714682 - Scanning stylus atomic force microscope with cantilever tracking and (1998-02-03),
12. 5705814 - Scanning probe microscope having automatic probe exchange and alignment (1998-01-06),
13. 5560244 - Scanning stylus atomic force microscope with cantilever tracking and (1996-10-01),
14. 5557156 - Scan control for scanning probe microscopes (1996-09-17),
15. 5553487 - Methods of operating atomic force microscopes to measure friction (1996-09-10),

Title: The Innovative Journey of Virgil B Elings

Introduction: Virgil B Elings is a renowned inventor based in Santa Barbara, CA, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Virgil B Elings holds several patents in various technological domains, showcasing his continuous dedication to pushing the boundaries of innovation.

Career Highlights: With a successful career spanning several decades, Virgil B Elings has established himself as a pioneer in the tech industry, with a focus on developing cutting-edge solutions to complex problems.

Collaborations: Throughout his career, Virgil B Elings has collaborated with leading experts and organizations in the tech sector, fostering a culture of innovation and knowledge sharing.

Conclusion: Virgil B Elings' passion for innovation and his relentless drive to create have solidified his reputation as a trailblazer in the world of technology, inspiring future generations of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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