Craig B Prater

Title: The Innovations of Craig B Prater

Introduction

Craig B Prater is a notable inventor based in Santa Barbara, California. He has made significant contributions to the field of atomic force microscopy, holding a total of six patents. His work has advanced the capabilities of scanning stylus atomic force microscopes, making them more efficient and effective in various applications.

Latest Patents

Among his latest patents is the "Scanning stylus atomic force microscope with cantilever tracking." This invention employs the optical lever technique and includes a light source along with a scanned optical assembly. The system guides light emitted from the light source onto a point on a cantilever during scanning. A moving light beam is created that automatically tracks the movement of the cantilever. This innovation allows for the measurement, calibration, or correction of the scanning mechanism's motion. Additionally, it enables the viewing of the sample and cantilever using an optical microscope.

Career Highlights

Craig B Prater has had a distinguished career, working with prominent organizations such as Digital Instruments and the University of California. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking advancements in microscopy technology.

Collaborations

Throughout his career, Prater has collaborated with notable individuals, including David A Grigg and Virgil B Elings. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Craig B Prater's contributions to atomic force microscopy have significantly impacted the field. His innovative patents and collaborations highlight his dedication to advancing scientific research and technology. His work continues to inspire future innovations in microscopy.