For the Inventor, By the Inventor

Enter assignee name

Ogdensburg, NY, United States of America

Defelsko Corporation

Calculating rank

USPTO Granted Patents = 28

EPO Patents = 2

Trademarks = 10

Forward Citations = 291

Loading Chart...

Loading Chart...

11 inventors (with patents filed for the assignee):

Frank J Koch (19 out of 24 patents)

Leon C Vandervalk (14 out of 17 patents)

David J Beamish (6 out of 6 patents)

4. Robert V Stachnik (2 out of 2 patents)

5. James E Davis (2 out of 29 patents)

6. Charles Edward Waddles (1 out of 1 patent)

7. Marlin S Walmer (1 out of 1 patent)

8. Rashid K Aidun (1 out of 1 patent)

9. Douglas Cleminshaw (1 out of 2 patents)

10. Alexander Eugene Roux, Iii (1 out of 1 patent)

11. Michael Beamish (1 out of 1 patent)

12. Steven Nowell (1 patent)

13. Nicholas Williams (0 patent)

14. Leon Vandervalk (0 patent)

15. Leon Vandervalk (0 patent)

Core Competencies:

Coating Thickness Gauge

Ultrasonic Measuring Gauge

Adhesion Tester

High Resolution Thickness Gauge

Nondestructive Testing

Magnetic Flux Density Sensor

Replica Tape Characterization

Powder Coating Measurement

Delay Line Probe

Reversible Display Screen

Anodic Capacity Gauge

Vending Machine Coin Acceptor

28 patents: Sort by Forward Citations

1. 12629912 - Apparatus and method for burnishing a replica tape (2026-05-19),

2. 9207174 - Apparatus and method for characterizing a replica tape (2015-12-08),

3. 9188672 - Ultrasonic measuring gauge (2015-11-17),

4. 8994933 - Apparatus and method for characterizing a replica tape (2015-03-31),

5. 8475100 - Wall fastener with knife blade and a string (2013-07-02),

6. RE41342 - Coating thickness gauge (2010-05-17),

7. 6282962 - High resolution ultrasonic thickness gauge (2001-09-04),

8. 6250160 - High resolution ultrasonic thickness gauge (2001-06-26),

9. 6122968 - Delay line for an ultrasonic probe and method of using same (2000-09-26),

10. 6050140 - Adhesion tester (2000-04-18),

11. 6026586 - Powder coating thickness gauge (2000-02-22),

12. 5979241 - Delay line for an ultrasonic probe and method of using same (1999-11-09),

13. 5930744 - Coating thickness gauge (1999-07-27),

14. 5777230 - Delay line for an ultrasonic probe and method of using same (1998-07-07),

15. 5723791 - High resolution ultrasonic coating thickness gauge (1998-03-03),

Company Overview

Defelsko Corporation, based in Ogdensburg, NY, specializes in the development and manufacturing of high-quality instruments for measuring coating thickness and surface profile. Their products are widely used across various industries, including automotive, aerospace, and construction, providing essential tools for quality control and assurance. The company is recognized for its commitment to innovation and precision, ensuring that clients can achieve optimal results in their coating applications and surface preparation processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

28 Patents

#1 in Ogdensburg, NY

#725 in New York

#12,026 in US

#23,325 in the World

Ogdensburg, NY, United States of America

Defelsko Corporation

Forward Citations = 291

11 inventors:

Frank J Koch (19 out of 24 patents)

Leon C Vandervalk (14 out of 17 patents)

David J Beamish (6 out of 6 patents)

4. Robert V Stachnik (2 out of 2 patents)

5. James E Davis (2 out of 29 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Defelsko Corporation. Retrieved from https://idiyas.com/company/defelsko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…