The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2010
Filed:
Apr. 02, 2000
Applicants:
Frank J. Koch, Ogdensburg, NY (US);
Leon C. Vandervalk, Brockville, CA;
David J. Beamish, Brockville, CA;
Inventors:
Frank J. Koch, Ogdensburg, NY (US);
Leon C. Vandervalk, Brockville, CA;
David J. Beamish, Brockville, CA;
Assignee:
DeFelsko Corporation, Ogdensburg, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/203 (2005.12);
U.S. Cl.
CPC ...
Abstract
A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.