David J Beamish

Title: **Innovator Spotlight: David J. Beamish**

Introduction

David J. Beamish is a prominent inventor hailing from Brockville, Canada, known for his significant contributions to measuring technology. With a total of six patents to his name, he has established himself as a leader in the field, particularly in the development of advanced gauging systems. His work exemplifies the intersection of innovation and practical application in various industries.

Latest Patents

David J. Beamish has recently made strides in the area of coating measurement through two notable patents. The first is a **Coating Thickness Gauge**, which features a modular design including a probe that generates a signal representative of coating thickness. This system integrates a PCMCIA card to convert the signal into a standard output format, enabling a portable computing unit to receive and process the data. The innovation allows users to record measurement data alongside descriptive textual or graphical notes, enhancing the contextual understanding of each measurement.

His second patent is the **High Resolution Ultrasonic Thickness Gauge**, designed to accurately determine the thickness of a coating on a substrate. This advanced gauge includes a transducer that emits ultrasonic signals, generating electrical signals corresponding to the reflections at various interfaces. With a sophisticated controller capable of conducting deconvolution analysis, the technology distinguishes between signals from different coating layers, even when they are thinner than the wavelength of the emitted ultrasonic signal.

Career Highlights

David is currently associated with Defelsko Corporation, a company renowned for its precision measurement instruments. Under his leadership and innovative spirit, he has contributed significantly to the company’s portfolio of products aimed at improving the quality and reliability of measurements in industrial applications.

Collaborations

During his career, David J. Beamish has collaborated with other notable professionals in the field, including Frank J. Koch and Leon C. Vandervalk. These collaborations have fostered a dynamic working environment that encourages the exchange of ideas and technological advancements, further enhancing the innovative spirit at Defelsko Corporation.

Conclusion

David J. Beamish's contributions to innovation in coating measurement technologies highlight his expertise and commitment to advancing industry standards. With ongoing developments and a clear vision for future innovations, he continues to be a pivotal figure in the realm of measuring technology. As the industry evolves, it will be interesting to see how his inventions influence further advancements and applications in various sectors.