Company Filing History:
Years Active: 2015
Title: **Inventor Spotlight: Robert V. Stachnik**
Introduction
Robert V. Stachnik is an innovative inventor based in Newark, Delaware. With a focus on advanced methods of measurement and characterization, Stachnik has contributed significantly to the field of materials science through his patented inventions. His work enhances the capabilities of industries requiring precise surface analysis.
Latest Patents
Stachnik holds two patents, with his most notable invention being an “Apparatus and method for characterizing a replica tape.” This invention involves a sophisticated mechanism to characterize a replica tape that has been embossed, compressed, or cast on a surface material. The design incorporates two holding components that secure the replica tape while a light source transmits light through it. An image sensor captures the intensity of the light at multiple measurement points, allowing a processing unit to convert this data into valuable measurement statistics related to the surface characteristics of the tape.
Career Highlights
Currently, Stachnik is affiliated with Defelsko Corporation, where he applies his expertise in material characterization. His innovative work at the company has positioned it as a leader in the industry, particularly in the development of tools that measure surface conditions with high precision. His contributions reflect both technical ingenuity and a commitment to advancing measurement technologies.
Collaborations
Throughout his career, Stachnik has had the opportunity to work alongside esteemed colleagues such as Leon C. Vandervalk and James E. Davis. This collaboration fosters an environment of shared knowledge and innovation, further enhancing the quality and impact of their work within Defelsko Corporation.
Conclusion
Robert V. Stachnik stands out as a prominent figure in the realm of invention and innovation. His patented methods for characterizing materials play a crucial role in various industries that depend on precise surface measurement. As he continues to work with talented professionals in his field, Stachnik's contributions will undoubtedly shape the future of material characterization technology.