Defelsko Corporation

Robert V Stachnik

James E Davis

Leon C Vandervalk

James Edward Davis

Leon Vandervalk

An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.

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Newark, DE, United States of America

Robert V Stachnik