The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2000
Filed:
Aug. 12, 1999
Leon C Vandervalk, Ontario, CA;
Defelsko Corporation, Ogdensburg, NY (US);
Abstract
An ultrasonic probe includes an ultrasonic transducer; a delay line acoustically coupled to said transducer so that ultrasonic vibrations may be transmitted into said delay line from said ultrasonic transducer in a first direction, said delay line includes a first section and a second section; the first and second sections forming an interface that is substantially perpendicular to said first direction; and the second section including a surface for coupling with a material to be investigated. The probe can be used to measure a thickness of a coating on a substrate by transmitting a signal in a first direction from the transducer into the delay line; measuring a time t.sub.1 for a first portion of the signal to travel round trip from the transducer and the interface; using the measured time t.sub.1 to calculate an expected time t.sub.2 for a second portion of the signal to travel round trip from the transducer to an opposite face of the delay line; measuring a time t.sub.3 that it takes for a third portion of the signal to travel round trip from the transducer and an interface between the coating and the substrate; and calculating a thickness of the coating based on a difference between the time t.sub.2 and the time t.sub.3.