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Gennevilliers, France

Cameca

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USPTO Granted Patents = 16

EPO Patents = 5

Trademarks = 1

Forward Citations = 89

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24 inventors (with patents filed for the assignee):

Emmanuel De Chambost (3 out of 3 patents)

Bernard Rasser (3 out of 3 patents)

Mikhail Yavor (2 out of 2 patents)

4. François Vurpillot (2 out of 2 patents)

5. Alain Bostel (2 out of 3 patents)

6. Bernard Deconihout (2 out of 3 patents)

7. Pierre Monsallut (2 out of 2 patents)

8. Mathias Tong (2 out of 2 patents)

9. Georges Slodzian (2 out of 6 patents)

10. Angela Vella (1 out of 2 patents)

11. Ludovic Renaud (1 out of 1 patent)

12. Chrystel Hombourger (1 out of 1 patent)

13. Juan Montero (1 out of 1 patent)

14. Pierre-Francois Staub (1 out of 1 patent)

15. Wielfried Vandervorst (1 out of 1 patent)

16 patents: Sort by Forward Citations

1. 8502139 - Mass analysis device with wide angular acceptance including a reflectron (2013-08-06),

2. 8373121 - Magnetic achromatic mass spectrometer with double focusing (2013-02-12),

3. 8276210 - Tomographic atom probe comprising an electro-optical generator of high-voltage electrical pulses (2012-09-25),

4. 8247766 - Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe (2012-08-21),

5. 8074292 - High resolution wide angle tomographic probe (2011-12-06),

6. 7049588 - Device for measuring the emission of X-rays produced by an object exposed to an electron beam (2006-05-23),

7. 6259530 - Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer (2001-07-10),

8. 5189304 - High transmission mass spectrometer with improved optical coupling (1993-02-23),

9. 5038045 - Composite electromagnetic lens with variable focal distance (1991-08-06),

10. 4983831 - Time-of-flight analysis method with continuous scanning and analyzer to (1991-01-08),

11. 4912325 - Method for sample analysis by sputtering with a particle beam, and (1990-03-27),

12. 4779046 - Electron beam integrated circuit tester (1988-10-18),

13. 4748325 - Method and device to discharge samples of insulating material during ion (1988-05-31),

14. 4564758 - Process and device for the ionic analysis of an insulating sample (1986-01-14),

15. 4508967 - Electronic optical apparatus comprising pyrolytic graphite elements (1985-04-02),

Company Overview

Cameca, headquartered in Gennevilliers, France, specializes in advanced analytical instrumentation and solutions for materials science, semiconductor, and life sciences applications. The company is renowned for its development of high-performance electron microscopes and ion probes, enabling precise analysis of materials at the atomic level. With a strong focus on innovation, Cameca supports research and industrial sectors globally, providing tools that enhance understanding of material properties and behaviors.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

16 Patents

#5 in Gennevilliers

#1,214 in France

#37,914 in the World

Gennevilliers, France

Cameca

Forward Citations = 89

24 inventors:

Emmanuel De Chambost (3 out of 3 patents)

Bernard Rasser (3 out of 3 patents)

Mikhail Yavor (2 out of 2 patents)

4. François Vurpillot (2 out of 2 patents)

5. Alain Bostel (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cameca. Retrieved from https://idiyas.com/company/cameca

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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