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Genevilliers, France

Cameca

USPTO Granted Patents = 16

EPO Patents = 5

Trademarks = 2

Forward Citations = 89

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26 inventors (with patents filed for the assignee):

Emmanuel De Chambost (3 out of 3 patents)

Bernard Rasser (3 out of 3 patents)

Mikhail Yavor (2 out of 2 patents)

4. François Vurpillot (2 out of 2 patents)

5. Alain Bostel (2 out of 3 patents)

6. Bernard Deconihout (2 out of 3 patents)

7. Pierre Monsallut (2 out of 2 patents)

8. Mathias Tong (2 out of 2 patents)

9. Georges Slodzian (2 out of 6 patents)

10. Angela Vella (1 out of 1 patent)

11. Ludovic Renaud (1 out of 1 patent)

12. Chrystel Hombourger (1 out of 1 patent)

13. Juan Montero (1 out of 1 patent)

14. Pierre-Francois Staub (1 out of 1 patent)

15. Wielfried Vandervorst (1 out of 1 patent)

16 patents: Sort by Forward Citations

1. 8502139 - Mass analysis device with wide angular acceptance including a reflectron (2013-08-06),

2. 8373121 - Magnetic achromatic mass spectrometer with double focusing (2013-02-12),

3. 8276210 - Tomographic atom probe comprising an electro-optical generator of high-voltage electrical pulses (2012-09-25),

4. 8247766 - Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe (2012-08-21),

5. 8074292 - High resolution wide angle tomographic probe (2011-12-06),

6. 7049588 - Device for measuring the emission of X-rays produced by an object exposed to an electron beam (2006-05-23),

7. 6259530 - Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer (2001-07-10),

8. 5189304 - High transmission mass spectrometer with improved optical coupling (1993-02-23),

9. 5038045 - Composite electromagnetic lens with variable focal distance (1991-08-06),

10. 4983831 - Time-of-flight analysis method with continuous scanning and analyzer to (1991-01-08),

11. 4912325 - Method for sample analysis by sputtering with a particle beam, and (1990-03-27),

12. 4779046 - Electron beam integrated circuit tester (1988-10-18),

13. 4748325 - Method and device to discharge samples of insulating material during ion (1988-05-31),

14. 4564758 - Process and device for the ionic analysis of an insulating sample (1986-01-14),

15. 4508967 - Electronic optical apparatus comprising pyrolytic graphite elements (1985-04-02),

Cameca is a leading supplier of advanced metrology and analytical instrumentation, offering cutting-edge solutions for a wide range of applications in research and industry. With a focus on delivering high-performance instruments that enable scientific breakthroughs, Cameca has established a strong reputation for innovation and expertise in the field of microanalysis and material characterization.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 9 2025

16 Patents

#1 in Genevilliers

#1,183 in France

#36,634 in the World

Genevilliers, France

Cameca

Forward Citations = 89

26 inventors:

Emmanuel De Chambost (3 out of 3 patents)

Bernard Rasser (3 out of 3 patents)

Mikhail Yavor (2 out of 2 patents)

4. François Vurpillot (2 out of 2 patents)

5. Alain Bostel (2 out of 3 patents)

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