Paris, France

Chrystel Hombourger

This inventor holds 1 USPTO granted patent. Top assignee: Cameca. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chrystel Hombourger. Retrieved from https://idiyas.com/inventor/chrystel-hombourger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations by Chrystel Hombourger

Introduction

Chrystel Hombourger is a notable inventor based in Paris, France. She has made significant contributions to the field of semiconductor manufacturing through her innovative inventions. Her work focuses on the measurement of X-ray emissions, which is crucial for the quality control of integrated circuits.

Latest Patents

Chrystel Hombourger holds a patent for a device designed to measure the emission of X-rays produced by an object exposed to an electron beam. This invention includes a subassembly or electron column that generates and controls the electron beam. It also features a support for positioning the object being measured, along with spectral analysis means for analyzing the emitted X-rays. The device is tailored to meet the sensitivity, resolution, and precision requirements of semiconductor manufacturers, particularly in checking the fabrication of integrated-circuit wafers.

Career Highlights

Hombourger is currently employed at Cameca, a company known for its advanced analytical instruments. Her role involves developing technologies that enhance the accuracy and efficiency of semiconductor manufacturing processes.

Collaborations

She has collaborated with notable colleagues such as Emmanuel De Chambost and Juan Montero, contributing to the advancement of their shared field.

Conclusion

Chrystel Hombourger's innovative work in measuring X-ray emissions has made a significant impact on semiconductor manufacturing. Her contributions continue to influence the industry and improve the quality of integrated circuits.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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