The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Oct. 13, 2009
Applicants:

François Vurpillot, Rouen, FR;

Alain Bostel, Le Petit Quevilly, FR;

Inventors:

François Vurpillot, Rouen, FR;

Alain Bostel, Le Petit Quevilly, FR;

Assignees:

Cameca, Gennevilliers, FR;

CNRS, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/00 (2010.01);
U.S. Cl.
CPC ...
Abstract

A tomographic atom probe uses electrical pulses applied to an electrode in order to carry out evaporation of the sample being analyzed. In order to produce these electrical pulses, the tomographic atom probe comprises a high-voltage generator connected to an electrode by an electrical connection comprising a chip of semiconductor material. The probe also comprises a light source which can be controlled in order to generate light pulses which are applied to the semiconductor chip. Throughout the illumination, the chip is rendered conductive, which puts the high-voltage generator and the electrode in electrical contact so that a potential step is applied to the latter. The probe also comprises means for applying a voltage step of opposite amplitude to the previous step at the end of a time interval Δt, so that the electrode finally receives a voltage pulse of duration Δt.


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