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Forward Citations = 340

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11 inventors (with patents filed for the assignee):

Michael E Fossey (6 out of 8 patents)

John C Stover (5 out of 10 patents)

Lee Dante Clementi (4 out of 6 patents)

4. Songping Gao (1 out of 7 patents)

5. Kirk Rodney Johnson (1 out of 10 patents)

6. Yuri A Eremin (1 out of 2 patents)

7. Richard Earl Bills (1 out of 18 patents)

8. Craig A Scheer (1 out of 3 patents)

9. Noel S Poduje (1 out of 22 patents)

10. Michael B Ferrara (1 out of 1 patent)

11. Eugene C Bates (1 out of 1 patent)

9 patents: Sort by Forward Citations

1. 6529270 - Apparatus and method for detecting defects in the surface of a workpiece (2003-03-04),

2. 6509965 - Wafer inspection system for distinguishing pits and particles (2003-01-21),

3. 6292259 - Wafer inspection system for distinguishing pits and particles (2001-09-18),

4. 6169601 - Method and apparatus for distinguishing particles from subsurface defects on a substrate using polarized light (2001-01-02),

5. 6122047 - Methods and apparatus for identifying the material of a particle (2000-09-19),

6. 6118525 - Wafer inspection system for distinguishing pits and particles (2000-09-12),

7. 5988971 - Wafer transfer robot (1999-11-23),

8. 5712701 - Surface inspection system and method of inspecting surface of workpiece (1998-01-27),

9. 5691812 - Calibration standard for calibrating a defect inspection system and a (1997-11-25),

Ade Optical Systems Corporation is a leading provider of optical solutions for a wide range of industries. With over 20 years of experience, we offer high-quality optical components, systems, and services tailored to meet our customers' specific needs. Our team of experts is dedicated to delivering innovative solutions that help our clients achieve their vision and business goals.

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Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

9 Patents

#98 in Charlotte, NC

#657 in North Carolina

#31,581 in US

Charlotte, NC, United States of America

Ade Optical Systems Corporation