Lee Dante Clementi

Title: Lee Dante Clementi: Innovator in Surface Inspection Technology

Introduction

Lee Dante Clementi is a notable inventor based in Lake Wylie, South Carolina. He has made significant contributions to the field of surface inspection technology, holding a total of 6 patents. His work primarily focuses on methods and apparatuses for mapping surface topography and detecting defects on substrates, particularly silicon wafers.

Latest Patents

Clementi's latest patents include a "Method and apparatus for mapping surface topography of a substrate." This invention allows for the creation of full surface maps of slope and height on highly smooth surfaces, such as silicon wafers. The apparatus utilizes a light source to create a light beam, along with scanning and wafer transport systems that enable the beam to scan the entire surface of the wafer. A quad cell light detector captures the specularly reflected beam, with each cell providing electrical signals indicative of the light received. A processor calculates changes in spot location and surface slopes, producing comprehensive maps of X- and Y-slope, while also flagging defects based on surface height gradients.

Another significant patent is the "Wafer inspection system for distinguishing pits and particles." This system detects defects on the surface of workpieces, such as silicon wafers, and differentiates between pit and particle defects. The inspection system includes a scanner that projects a beam of P-polarized light across the workpiece surface. By analyzing the angular distribution of the scattered light, the system effectively distinguishes between different types of defects.

Career Highlights

Throughout his career, Clementi has worked with several companies, including Ade Optical Systems Corporation and Estek Corporation. His experience in these organizations has contributed to his expertise in surface inspection technologies and has facilitated the development of his innovative patents.

Collaborations

Clementi has collaborated with notable professionals in his field, including Michael E. Fossey and John C. Stover. These collaborations have likely enriched his work and contributed to the advancements in surface inspection technology.

Conclusion

Lee Dante Clementi is a distinguished inventor whose work in surface inspection technology has led to significant advancements in the field. His innovative patents and career achievements reflect his dedication to improving methods for mapping and inspecting substrates.