The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Aug. 10, 2012
Applicants:

Mill-jer Wang, Hsinchu, TW;

Chewn-pu Jou, Hsinchu, TW;

Ching-nen Peng, Hsinchu, TW;

Huan-neng Chen, Hsinchu, TW;

Hung-chih Lin, Hsinchu, TW;

Kuang Kai Yen, Hsinchu, TW;

Hao Chen, Hsinchu, TW;

Feng Wei Kuo, Hsinchu, TW;

Ming-chieh Liu, Hsinchu, TW;

Tsung-hsiung LI, Hsinchu, TW;

Inventors:

Mill-Jer Wang, Hsinchu, TW;

Chewn-Pu Jou, Hsinchu, TW;

Ching-Nen Peng, Hsinchu, TW;

Huan-Neng Chen, Hsinchu, TW;

Hung-Chih Lin, Hsinchu, TW;

Kuang Kai Yen, Hsinchu, TW;

Hao Chen, Hsinchu, TW;

Feng Wei Kuo, Hsinchu, TW;

Ming-Chieh Liu, Hsinchu, TW;

Tsung-Hsiung Li, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 23/02 (2006.01); G06F 17/50 (2006.01); H01L 23/00 (2006.01); H01L 25/065 (2006.01); G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2889 (2013.01); G06F 17/5068 (2013.01); G01R 31/3025 (2013.01); H01L 24/16 (2013.01); H01L 25/0657 (2013.01); H01L 2224/16145 (2013.01); H01L 2224/16225 (2013.01); H01L 2225/06513 (2013.01); H01L 2225/06517 (2013.01); H01L 2225/06565 (2013.01); H01L 2225/06596 (2013.01); H01L 2924/15192 (2013.01); H01L 2924/15311 (2013.01);
Abstract

A three-dimensional integrated circuit (3DIC) and wireless information access methods thereof are provided. The proposed 3DIC includes a semiconductor structure, and a wireless power device (WPD) formed on the semiconductor structure for wirelessly receiving a power for operating a function selected from a group consisting of probing the semiconductor structure, testing the semiconductor structure and accessing a first information from the semiconductor structure.


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