The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

May. 04, 2005
Applicants:

Khee Yong Lim, Singapore, SG;

Wenhe Lin, Singapore, SG;

Chung Woh Lai, Singapore, SG;

Yong Meng Lee, Singapore, SG;

Liang Choo Hsia, Singapore, SG;

Young Way Teh, Singapore, SG;

John Sudijono, Singapore, SG;

Wee Leng Tan, Singapore, SG;

Hui Peng Koh, Singapore, SG;

Inventors:

Khee Yong Lim, Singapore, SG;

Wenhe Lin, Singapore, SG;

Chung Woh Lai, Singapore, SG;

Yong Meng Lee, Singapore, SG;

Liang Choo Hsia, Singapore, SG;

Young Way Teh, Singapore, SG;

John Sudijono, Singapore, SG;

Wee Leng Tan, Singapore, SG;

Hui Peng Koh, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
Abstract

An example method embodiment forms spacers that create tensile stress on the substrate on both the PFET and NFET regions. We form PFET and NFET gates and form tensile spacers on the PFET and NFET gates. We implant first ions into the tensile PFET spacers to form neutralized stress PFET spacers. The neutralized stress PFET spacers relieve the tensile stress created by the tensile stress spacers on the substrate. This improves device performance.


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