The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Jun. 23, 2022
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Cheng-Ying Huang, Hillsboro, OR (US);

Patrick Morrow, Portland, OR (US);

Quan Shi, Portland, OR (US);

Rohit Galatage, Hillsboro, OR (US);

Nicole K. Thomas, Portland, OR (US);

Munzarin F. Qayyum, Hillsboro, OR (US);

Jami A. Wiedemer, Scappoose, OR (US);

Gilbert Dewey, Beaverton, OR (US);

Mauro J. Kobrinsky, Portland, OR (US);

Marko Radosavljevic, Portland, OR (US);

Jack T. Kavalieros, Portland, OR (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 84/85 (2025.01); H10D 30/67 (2025.01); H10D 62/10 (2025.01); H10D 62/13 (2025.01); H10W 20/20 (2026.01);
U.S. Cl.
CPC ...
H10D 84/853 (2025.01); H10D 30/6735 (2025.01); H10D 30/6757 (2025.01); H10D 62/121 (2025.01); H10D 62/151 (2025.01); H10W 20/20 (2026.01);
Abstract

An integrated circuit structure includes a device layer including an upper device above a lower device. The upper device includes an upper source or drain region, and an upper source or drain contact coupled to the upper source or drain region. The lower device includes a lower source or drain region. A first conductive feature is below the device layer, where the first conductive feature is coupled to the lower source or drain region. A second conductive feature vertically extends through the device layer. In an example, the second conductive feature is to couple (i) the first conductive feature below the device layer and (ii) an interconnect structure above the device layer. Thus, the first and second conductive features facilitate a connection between the interconnect structure on the frontside of the integrated circuit and the lower source or drain region towards the backside of the integrated circuit.


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