The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Sep. 04, 2020
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Seiyon Kim, Portland, OR (US);

Kelin J. Kuhn, Aloha, OR (US);

Tahir Ghani, Portland, OR (US);

Anand S. Murthy, Portland, OR (US);

Mark Armstrong, Portland, OR (US);

Rafael Rios, Portland, OR (US);

Abhijit Jayant Pethe, Hillsboro, OR (US);

Willy Rachmady, Beaverton, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 29/786 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01); H01L 21/306 (2006.01); H01L 21/3105 (2006.01); H01L 21/3115 (2006.01); H01L 29/08 (2006.01); H01L 29/66 (2006.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
H01L 29/0673 (2013.01); H01L 21/30604 (2013.01); H01L 21/3105 (2013.01); H01L 21/31155 (2013.01); H01L 29/0847 (2013.01); H01L 29/42392 (2013.01); H01L 29/66545 (2013.01); H01L 29/66553 (2013.01); H01L 29/78 (2013.01); H01L 29/78696 (2013.01); B82Y 40/00 (2013.01);
Abstract

A nanowire device having a plurality of internal spacers and a method for forming said internal spacers are disclosed. In an embodiment, a semiconductor device comprises a nanowire stack disposed above a substrate, the nanowire stack having a plurality of vertically-stacked nanowires, a gate structure wrapped around each of the plurality of nanowires, defining a channel region of the device, the gate structure having gate sidewalls, a pair of source/drain regions on opposite sides of the channel region; and an internal spacer on a portion of the gate sidewall between two adjacent nanowires, internal to the nanowire stack. In an embodiment, the internal spacers are formed by depositing spacer material in dimples etched adjacent to the channel region. In an embodiment, the dimples are etched through the channel region. In another embodiment, the dimples are etched through the source/drain region.


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