The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Jun. 25, 2013
Applicant:

Rohm and Haas Electronic Materials Llc, Marlborough, MA (US);

Inventors:

Cong Liu, Shrewsbury, MA (US);

Chunyi Wu, Shrewsbury, MA (US);

Gerhard Pohlers, Needham, MA (US);

Gregory P. Prokopowicz, Worcester, MA (US);

Mingqi Li, Shrewsbury, MA (US);

Cheng-Bai Xu, Southborough, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); G03F 7/038 (2006.01); G03F 7/20 (2006.01); G03F 7/039 (2006.01); C08F 220/52 (2006.01); C07C 233/16 (2006.01); C07C 233/02 (2006.01); C08F 220/56 (2006.01); C07C 233/00 (2006.01); C07C 233/01 (2006.01); C08F 220/58 (2006.01);
U.S. Cl.
CPC ...
G03F 7/004 (2013.01); C07C 233/00 (2013.01); C07C 233/01 (2013.01); C07C 233/02 (2013.01); C07C 233/16 (2013.01); C08F 220/52 (2013.01); C08F 220/56 (2013.01); C08F 220/58 (2013.01); G03F 7/0382 (2013.01); G03F 7/0397 (2013.01); G03F 7/2041 (2013.01);
Abstract

New photoresist compositions are provided that comprise a component that comprises an amide group and multiple hydroxyl groups. Preferred photoresists of the invention may comprise a resin with photoacid-labile groups; a photoacid generator compound; and an amide component with multiple hydroxyl groups that can function to decrease undesired photogenerated-acid diffusion out of unexposed regions of a photoresist coating layer.


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