Yuushin Kimura

Title: Yuushin Kimura: Innovator in Semiconductor Testing Technology

Introduction

Yuushin Kimura is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of semiconductor testing, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

Kimura's latest patents include advancements in semiconductor testing circuits and methods. One of his patents describes a semiconductor testing circuit that features a signal processing section. This section supplies a test signal from a tester to multiple devices under test (DUTs) and synthesizes response signals to generate a test result. Additionally, the test result output section modifies the voltage level of the test result before sending it back to the tester. Another patent focuses on a semiconductor apparatus testing arrangement designed for testing multiple semiconductor devices on a substrate. This arrangement includes testing units with probe needles that correspond to the electrode terminals of the semiconductor devices.

Career Highlights

Throughout his career, Yuushin Kimura has worked with prominent companies such as Fujitsu Corporation and Fujitsu Semiconductor Limited. His experience in these organizations has allowed him to develop and refine his expertise in semiconductor technology.

Collaborations

Kimura has collaborated with notable colleagues, including Yuichi Watanabe and Kiyotaka Shinada. These partnerships have contributed to his innovative work in the semiconductor field.

Conclusion

Yuushin Kimura's contributions to semiconductor testing technology reflect his dedication to innovation and excellence. His patents demonstrate a commitment to advancing the capabilities of semiconductor testing, making him a significant figure in the industry.