Fujitsu Corporation

Fujitsu Semiconductor Limited

Yuushin Kimura

Shigeyuki Maruyama

Kazuhiro Tashiro

Yoshikazu Arisaka

Eiji Takada

Kouji Uesaka

Takayuki Katayama

Yuichi Watanabe

Shigeru Goto

Yasuhiko Tandou

Tetsu Ozawa

Kiyotaka Shinada

A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.

Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method

A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the probe needles.

Semiconductor apparatus testing arrangement and semiconductor apparatus testing method

Growing community of inventors

Yokohama, Japan

Yuushin Kimura