The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Sep. 01, 2010
Yuichi Watanabe, Yokohama, JP;
Kiyotaka Shinada, Yokohama, JP;
Yuushin Kimura, Yokohama, JP;
Shigeru Goto, Yokohama, JP;
Yasuhiko Tandou, Yokohama, JP;
Eiji Takada, Kawasaki, JP;
Kouji Uesaka, Kawasaki, JP;
Yuichi Watanabe, Yokohama, JP;
Kiyotaka Shinada, Yokohama, JP;
Yuushin Kimura, Yokohama, JP;
Shigeru Goto, Yokohama, JP;
Yasuhiko Tandou, Yokohama, JP;
Eiji Takada, Kawasaki, JP;
Kouji Uesaka, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Fujitsu Semiconductor Limited, Yokohama, JP;
Abstract
A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.