The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Jan. 26, 2006
Shigeyuki Maruyama, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Kazuhiro Tashiro, Kawasaki, JP;
Takayuki Katayama, Kawasaki, JP;
Tetsu Ozawa, Kawasaki, JP;
Yuushin Kimura, Kawasaki, JP;
Shigeyuki Maruyama, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Kazuhiro Tashiro, Kawasaki, JP;
Takayuki Katayama, Kawasaki, JP;
Tetsu Ozawa, Kawasaki, JP;
Yuushin Kimura, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the probe needles.