Tokyo, Japan

Yutaka Hojo

USPTO Granted Patents = 7 

Average Co-Inventor Count = 4.9

ph-index = 2

Forward Citations = 9(Granted Patents)


Location History:

  • Hitachinaka, JP (2010 - 2015)
  • Tokyo, JP (2015 - 2019)

Company Filing History:


Years Active: 2010-2019

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7 patents (USPTO):Explore Patents

Title: Yutaka Hojo: Innovator in Semiconductor Measurement Technology

Introduction

Yutaka Hojo is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor measurement technology, holding a total of 7 patents. His work focuses on developing advanced systems that enhance the evaluation and processing of semiconductor devices.

Latest Patents

Among his latest innovations are a pattern-measuring apparatus and a semiconductor-measuring system. These inventions are designed to obtain evaluation results that facilitate the selection of appropriate processing methods for semiconductor devices. The pattern-measuring apparatus includes an arithmetic device that compares the circuit pattern of an electronic device with a reference pattern. This device classifies the circuit pattern based on a comparison of measurement results against at least two threshold values.

Career Highlights

Yutaka Hojo is associated with Hitachi High-Technologies Corporation, where he continues to push the boundaries of semiconductor technology. His work has been instrumental in improving the accuracy and efficiency of semiconductor measurements, which are critical in the electronics industry.

Collaborations

Throughout his career, Yutaka has collaborated with notable colleagues, including Hiroyuki Shindo and Hitoshi Sugahara. These partnerships have contributed to the advancement of innovative solutions in semiconductor technology.

Conclusion

Yutaka Hojo's contributions to semiconductor measurement technology exemplify his dedication to innovation. His patents and collaborative efforts continue to influence the industry positively.

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