This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignees: Jeol Ltd., Japan Display Inc.. Active years: 2019-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019-2022
Title: Yuta Murakami: Innovator in Charged Particle Beam Technology
Introduction
Yuta Murakami is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 4 patents. His innovative designs have advanced the capabilities of imaging devices and sample holders.
Latest Patents
One of his latest patents is the Sample Plate Holder, which features a holder body equipped with a first spring array and a second spring array. This design allows for the mounting of three sample plates, with pressing-up forces applied from both spring arrays. However, the upward movement of each sample plate is restricted by the inner surface of a cover. Another notable patent is the Charged Particle Beam Apparatus, which includes an imaging device that captures images of a sample holder held by a sample stage. This apparatus incorporates a light emitter device array and a mask array, generating multiple light beams while masking their center parts to create shadows covered by the peripheral parts of the beams.
Career Highlights
Throughout his career, Yuta Murakami has worked with notable companies such as Jeol Ltd. and Japan Display Inc. His experience in these organizations has contributed to his expertise in developing advanced technologies in his field.
Collaborations
Yuta has collaborated with several talented individuals, including Yoshikazu Nemoto and Akira Abe. These partnerships have fostered innovation and creativity in his projects.
Conclusion
Yuta Murakami's contributions to the field of charged particle beam technology are noteworthy. His patents reflect his commitment to innovation and excellence in engineering. His work continues to influence advancements in imaging devices and sample handling.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

