Tokyo, Japan

Yuta Murakami


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019-2022

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4 patents (USPTO):Explore Patents

Title: Yuta Murakami: Innovator in Charged Particle Beam Technology

Introduction

Yuta Murakami is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 4 patents. His innovative designs have advanced the capabilities of imaging devices and sample holders.

Latest Patents

One of his latest patents is the Sample Plate Holder, which features a holder body equipped with a first spring array and a second spring array. This design allows for the mounting of three sample plates, with pressing-up forces applied from both spring arrays. However, the upward movement of each sample plate is restricted by the inner surface of a cover. Another notable patent is the Charged Particle Beam Apparatus, which includes an imaging device that captures images of a sample holder held by a sample stage. This apparatus incorporates a light emitter device array and a mask array, generating multiple light beams while masking their center parts to create shadows covered by the peripheral parts of the beams.

Career Highlights

Throughout his career, Yuta Murakami has worked with notable companies such as Jeol Ltd. and Japan Display Inc. His experience in these organizations has contributed to his expertise in developing advanced technologies in his field.

Collaborations

Yuta has collaborated with several talented individuals, including Yoshikazu Nemoto and Akira Abe. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Yuta Murakami's contributions to the field of charged particle beam technology are noteworthy. His patents reflect his commitment to innovation and excellence in engineering. His work continues to influence advancements in imaging devices and sample handling.

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