Tsukuba, Japan

Yusuke Matsuura



Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Tsukuba, JP (2022)
  • Ibaraki, JP (2020 - 2023)

Company Filing History:


Years Active: 2020-2023

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4 patents (USPTO):Explore Patents

Title: Yusuke Matsuura: Innovator in Particle Measurement Technology

Introduction

Yusuke Matsuura is a prominent inventor based in Tsukuba, Japan. He has made significant contributions to the field of particle measurement technology, holding a total of four patents. His innovative work focuses on developing devices and methods that enhance the accuracy and efficiency of particle size analysis.

Latest Patents

Matsuura's latest patents include a particle measuring device and a calibration method. The particle measuring device is designed for easy calibration using calibration particles. It captures images of target objects and employs an image analyzer to acquire multiple images at predetermined time intervals. This device specifies the mean-square displacement of a bright point of a calibration particle and a target particle, allowing for precise particle size analysis. Another notable invention is a particulate observation device that utilizes light scattering to determine the three-dimensional position of particles. This device can accurately measure particle sizes and impart various properties of the particles.

Career Highlights

Throughout his career, Yusuke Matsuura has worked with esteemed organizations such as the National Institute of Advanced Industrial Science and Technology and Rion Company Ltd. His experience in these institutions has contributed to his expertise in particle measurement technologies.

Collaborations

Matsuura has collaborated with notable colleagues, including Haruhisa Kato and Ayako Nakamura. Their joint efforts have further advanced the field of particle measurement and analysis.

Conclusion

Yusuke Matsuura's innovative contributions to particle measurement technology have established him as a key figure in this field. His patents reflect a commitment to enhancing measurement accuracy and efficiency, making significant strides in scientific research and industrial applications.

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