The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Sep. 30, 2019
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Rion Co., Ltd., Tokyo, JP;
Kioxia Corporation, Tokyo, JP;
Haruhisa Kato, Ibaraki, JP;
Yusuke Matsuura, Ibaraki, JP;
Ayako Nakamura, Ibaraki, JP;
Kaoru Kondo, Tokyo, JP;
Takuya Tabuchi, Tokyo, JP;
Hiroshi Tomita, Tokyo, JP;
Hidekazu Hayashi, Tokyo, JP;
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;
RION Co., Ltd., Tokyo, JP;
Kioxia Corporation, Tokyo, JP;
Abstract
For an easy calibration using calibration particles, provided is a measuring device to capture images of target objects. An image analyzer acquires multiple images obtained at a predetermined time interval, (a) specifies the mean-square displacement of a bright point of a calibration particle based on the displacement of the bright point of the calibration particle in the multiple images in a calibration mode, and (b) specifies the mean-square displacement of a bright point of the target particle based on the displacement of the bright point of the target particle in the multiple images in a measurement mode. A particle size analyzer (c) derives the particle size of the target particle from the mean-square displacement of the bright point of the target particle based on the mean-square displacement of the bright point of the calibration particle and the particle size of the calibration particle in an analysis mode.