The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Mar. 30, 2018
Rion Co., Ltd., Tokyo, JP;
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Kaoru Kondo, Tokyo, JP;
Takuya Tabuchi, Tokyo, JP;
Kazuna Bando, Tokyo, JP;
Haruhisa Kato, Ibaraki, JP;
Yusuke Matsuura, Ibaraki, JP;
RION Co., Ltd., Tokyo, JP;
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;
Abstract
Provided is a particle measuring device and a particle measuring method for measuring a particle size with favorable accuracy. A flow cell () includes a flow passage () of sample fluid. An irradiation optical system () irradiates, with light from a light source (), the sample fluid in the flow passage (). An imaging unit () captures, from an extension direction of the flow passage (), an image of scattered light from the particle in a detection region in the flow passage (), the light passing through the detection region. A particle size specifying unit specifies a movement amount of the particle in a two-dimensional direction by Brownian motion based on multiple still images of a particle image captured at a predetermined frame rate by the imaging unit (), thereby specifying the particle size of the particle from the movement amount in the two-dimensional direction.