The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Dec. 05, 2017
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Haruhisa Kato, Tsukuba, JP;

Yusuke Matsuura, Tsukuba, JP;

Ayako Nakamura, Tsukuba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/708 (2006.01); G01F 1/7086 (2022.01); G01N 15/02 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01F 1/7086 (2013.01); G01N 15/0227 (2013.01); G01N 2015/0053 (2013.01);
Abstract

A measuring method enabling simple and accurate measurement of a flow velocity distribution in a flow field inside a flow passage of an optical cell and a particle size-measuring method using the measuring method are provided. Providing a tracer particle of a smaller size than wavelength λ of laser light into the flow passage and capturing a bright spot attributed to light scattering from tracer particles by camera, and obtaining the flow velocity distribution by the analysis unit by obtaining an amount of movement of each tracer particle from movement of the bright spot and correcting a Brownian motion component from a correlation between an average value of variations of the amount of movement and Brownian motion are performed.


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