Tokyo, Japan

Yusuke Konno

This inventor holds 11 USPTO granted patents, plus 2 CIPO patents and 11 EPO patents. Top assignees: Nippon Steel Sumitomo Metal Corporation, Nippon Steel Corporation. Active years: 2018-2025.


% Patents Active = 100.0


 

Average Co-Inventor Count = 4.4

ph-index = 3

Forward Citations = 39(Granted Patents)


Company Filing History:


Years Active: 2018-2025

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11 patents (USPTO):Explore Patents

Title: Yusuke Konno: Innovator in Surface Measurement Technologies

Introduction

Yusuke Konno is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of surface measurement technologies, holding a total of 11 patents. His innovative work focuses on developing apparatuses and methods that enhance the accuracy and reliability of surface measurements.

Latest Patents

Among his latest patents, Konno has developed a surface measurement apparatus and a surface measurement method. This technology is designed to reliably measure the surface of an object with a wide width. The apparatus includes multiple light sources that emit line beams, allowing for precise measurements of surfaces moving in predetermined directions. Additionally, he has created a shape inspection apparatus that utilizes illumination light sources and a line sensor camera to analyze the inclination of surfaces, ensuring high accuracy in measurements.

Career Highlights

Yusuke Konno has worked with notable companies such as Nippon Steel Sumitomo Metal Corporation and Nippon Steel Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in measurement technologies.

Collaborations

Throughout his career, Konno has collaborated with esteemed colleagues, including Nobuhiro Furuya and Toshio Akagi. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Yusuke Konno's contributions to surface measurement technologies exemplify his dedication to innovation. His patents reflect a commitment to enhancing measurement accuracy and reliability in various applications.

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