The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
May. 13, 2016
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Atsuhiro Hibi, Tokyo, JP;
Yusuke Konno, Tokyo, JP;
Nobuhiro Furuya, Tokyo, JP;
Tomohiro Kuroiwa, Tokyo, JP;
NIPPON STEEL & SUMITOMO METAL CORPORATION, Tokyo, JP;
Abstract
[Object] To provide a shape inspection method, a shape inspection apparatus, and a program capable of adjusting the brightness and the thickness of a light-section line in a light-section image more simply and objectively. [Solution] A shape inspection method according to the present invention includes: a light-section image generation step in which linear laser light is applied to an object surface from a laser light source and a light-section line based on the laser light on the object surface is imaged by an imaging apparatus, and thereby a light-section image that is a captured image used for a light-section method is generated; an indicator value calculation step in which a thickness indicator value indicating a thickness of the light-section line and a brightness indicator value indicating a brightness of the light-section line in the light-section image are calculated; a setting changing step in which setting of at least one of the laser light source and the imaging apparatus is changed so that each of the calculated thickness indicator value and the calculated brightness indicator value is within a prescribed range uniquely set in advance; and a shape inspection step in which image processing is performed on the light-section image after each of the thickness indicator value and the brightness indicator value is brought within the prescribed range, and thereby a shape of the object surface is inspected.