Tokyo, Japan

Atsuhiro Hibi

This inventor holds 7 USPTO granted patents, plus 2 CIPO patents and 7 EPO patents. Top assignees: Nippon Steel Corporation, Nippon Steel Sumitomo Metal Corporation. Active years: 2019-2025.


% Patents Active = 100.0


 

Average Co-Inventor Count = 4.9

ph-index = 2

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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7 patents (USPTO):Explore Patents

Title: Atsuhiro Hibi: Innovator in Surface and Shape Measurement Technologies

Introduction

Atsuhiro Hibi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of surface and shape measurement technologies. With a total of 7 patents to his name, Hibi's work has advanced the capabilities of measurement apparatuses used in various industries.

Latest Patents

Hibi's latest patents include a surface measurement apparatus and a surface measurement method designed to reliably measure the surface of objects with wide widths. This innovative apparatus features multiple light sources that emit line beams, allowing for precise measurements of surfaces moving in predetermined directions. Additionally, he has developed a shape measurement apparatus that utilizes a linear light source to project light onto strip-shaped bodies, capturing reflected images to calculate their surface shapes accurately.

Career Highlights

Throughout his career, Atsuhiro Hibi has worked with notable companies such as Nippon Steel Corporation and Nippon Steel Sumitomo Metal Corporation. His experience in these organizations has contributed to his expertise in measurement technologies and innovation.

Collaborations

Hibi has collaborated with talented individuals in his field, including Nobuhiro Furuya and Yusuke Konno. These collaborations have fostered a creative environment that has led to the development of advanced measurement solutions.

Conclusion

Atsuhiro Hibi's contributions to surface and shape measurement technologies have established him as a key figure in the field. His innovative patents and collaborations continue to influence advancements in measurement apparatuses.

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