The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Dec. 07, 2018
Nippon Steel Corporation, Tokyo, JP;
NIPPON STEEL CORPORATION, Tokyo, JP;
Abstract
A shape inspection apparatus includes N illumination light sources, a line sensor camera, a measurement control unit, and a data processing unit. The measurement control unit controls the illumination light sources to modulate luminescence intensities at a frequency that is 1/N of a frequency of a scan rate of the line sensor camera, and to emit lights by sequentially repeating N different patterns of illumination intensity ratios. The data processing unit generates a first separated image and a second separated image based on a photographed image, generates a first mixing elimination image acquired by removing an unnecessary illumination component from the first separated image, and a second mixing elimination image acquired by removing an unnecessary illumination component from the second separated image, and calculates an inclination of the surface of the strip-shaped body based on a difference between the first mixing elimination image and the second mixing elimination image.