Tokyo, Japan

Yusuke Abe

This inventor holds 23 USPTO granted patents and 4 published patent applications and 7 EPO patents, primarily in Charged Particle Beam Technology. Top assignees: Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation, Nagano Keiki Co., Ltd.. Active years: 2005-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yusuke Abe. Retrieved from https://idiyas.com/inventor/yusuke-abe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23 

% Patents Active = 87.0

 

Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 12(Granted Patents)


Location History:

  • Kasugai, JP (2021)
  • Aichi, JP (2022)
  • Tokyo, JP (2005 - 2024)

Company Filing History:


Years Active: 2005-2026

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Areas of Expertise:
Charged Particle Beam Device
Electron Microscope
Pattern Measurement
Calibration Sample
Anticancer Agent Screening
Physical Quantity Measurement
Scanning Electron Microscope
Corrosion Protection
Power Converter
Sensor Module
Vacuum Cleaner
Artificial Heart-Lung Apparatus
23 patents (USPTO):Explore Patents

Title: **Yusuke Abe: Innovator in Pattern Measurement Technology**

Introduction

Yusuke Abe is an accomplished inventor based in Tokyo, Japan, recognized for his significant contributions to the field of pattern measurement technology. With a total of 19 patents to his name, Abe stands out as a key figure in advancing methodologies that enhance the precision of measurements in various applications.

Latest Patents

Yusuke Abe's most recent patents include the "Pattern Measurement Device and Pattern Measurement Method" and a "Charged Particle Beam System." The former innovation offers a computation device designed to measure the dimensions of patterns formed on samples. This device utilizes signals obtained from a charged particle beam, featuring a positional deviation calculation unit and a pattern inclination calculation unit. The device's control mechanism adjusts the beam tilt angle to ensure accurate measurements. Meanwhile, the charged particle beam system is aimed at acquiring high-quality images while improving throughput. It incorporates a charged particle beam device and a computer system to optimize focus and electric field values during measurements.

Career Highlights

Throughout his career, Yusuke Abe has had the opportunity to work with notable companies, including Hitachi High-Tech Corporation and Nagano Keiki Co., Ltd. His roles within these organizations have allowed him to develop and refine groundbreaking measurement technologies, solidifying his reputation as a leading innovator.

Collaborations

Yusuke Abe has collaborated with esteemed colleagues, including Kenji Tanimoto and Shuji Tohyama. These partnerships have facilitated the exchange of ideas and expertise, enhancing the development of innovative solutions in the field of pattern measurement and technology.

Conclusion

Yusuke Abe continues to be a prominent figure in the realm of technological innovation. His dedication to advancing measurement techniques and his collaborative efforts with other experts underscore his vital role in progressing the industry. With a wealth of patents, Abe's influence is sure to inspire future advancements in pattern measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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