Yung-Yu Yang

Title: Yung-Yu Yang: Semiconductor Manufacturing and Wafer Inspection Innovations.

Introduction. Yung-Yu Yang is an inventor based in Tainan, Taiwan, with 4 patents. His disclosed work includes methods for manufacturing process control and wafer backside defect detection.

Latest Patents. “Manufacturing Control Method and Non-Transitory Computer Readable Media” describes a computer-based approach to monitoring manufacturing data. The method divides filtered data into subgroups, calculates standard deviations, and uses them to establish and adjust warning limits. When sensing data exceeds either limit, the system triggers a warning signal.

“Wafer Backside Defect Detection Method and Wafer Backside Defect Detection Apparatus” presents an image-analysis method for identifying wafer defects. It crops the wafer image’s peripheral edge area around at least one notch and connects adjacent white pixels to identify abnormal regions. The method classifies a wafer as having a roughness defect when the combined area of the largest N abnormal regions exceeds 10% of the wafer area. It identifies a scratch defect when that combined area is below 1% and the largest abnormal region exceeds a predetermined length.

Career Highlights. Yang’s listed patent work is associated with United Microelectronics Corporation, a semiconductor company. His inventions address manufacturing monitoring and automated inspection of wafer surfaces.

Collaborations. Chen-Hui Huang and Chia-Feng Hsiao are identified as Yang’s coworkers.

Conclusion. Yung-Yu Yang’s patent portfolio reflects a focus on practical semiconductor manufacturing innovations, particularly process warnings and wafer backside defect detection.