Okegawa, Japan

Yuko Inoue


Average Co-Inventor Count = 6.8

ph-index = 2

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 2003-2005

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3 patents (USPTO):

Title: Yuko Inoue: Innovator in Micro-Miniature Pattern Inspection

Introduction

Yuko Inoue, an esteemed inventor based in Okegawa, Japan, has made significant contributions to the field of micro-miniature technology. With a remarkable portfolio of three patents, she is well-regarded for her innovative approach to inspecting and detecting foreign matter in micro-scale patterns.

Latest Patents

Her latest invention focuses on an "Inspecting method and apparatus for repeated micro-miniature patterns." This advanced apparatus includes a range of components designed for effective inspection of micro-miniature patterns formed on surfaces. The device features an inspection light illuminating system that directs light onto the surface, allowing for the detection of scattered light through a specialized detector. The system is adept at gathering information regarding foreign matter on the inspected surface, revealing two sets of data: first, derived from light scattering, and second, acquired through bright field illumination that captures images of the foreign matter. Both sets of information are accessible via a display screen, ensuring comprehensive insights into the inspection process.

Career Highlights

Yuko Inoue's career has been marked by her work at renowned companies, including Hitachi Electronics Engineering Co., Ltd. Her experience in this industry has provided her with a wealth of knowledge and expertise, which she applies to her inventive endeavors.

Collaborations

Inoue has had the opportunity to collaborate with notable professionals in her field, including Tetsuya Watanabe and Junichi Taguchi. Their teamwork demonstrates a shared commitment to innovation and excellence in technology, further propelling advancements in micro-miniature inspection methods.

Conclusion

Yuko Inoue’s innovative contributions to the field of micro-miniature pattern inspection reflect her dedication to improving detection methods and technologies. With her extensive patent portfolio and collaborations, she continues to be a pivotal figure in the realm of technological advancements.

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