Yuan-Chang Liu

Title: Innovations of Yuan-Chang Liu in Semiconductor Technology

Introduction

Yuan-Chang Liu is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on enhancing the performance and reliability of semiconductor devices.

Latest Patents

One of his latest patents is titled "Method of characterizing a semiconductor device and semiconductor device." This innovative method involves providing a silicon-on-insulator (SOI) substrate with at least a body-tied (BT) SOI device and a BT dummy device for measurement. The process includes measuring tunneling currents and scattering parameters of both devices, allowing for the extraction of gate-related capacitances of the floating body SOI device.

Another notable patent is "Electrostatic discharge protection structure and a method for forming the same." This patent describes a device structure and a method for fabricating an electrostatic discharge (ESD) protection circuit on a semiconductor device. The method includes forming a layer of silicon oxide on a substrate, implanting n-type ions to create source/drain regions, and depositing a metal layer to form salicide layers on these regions.

Career Highlights

Yuan-Chang Liu is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His work at this organization has allowed him to push the boundaries of semiconductor technology and contribute to advancements in the field.

Collaborations

He has collaborated with notable colleagues such as Mu-Chun Wang and Shih-Chieh Kao, further enhancing the innovative efforts within his team.

Conclusion

Yuan-Chang Liu's contributions to semiconductor technology through his patents and work at United Microelectronics Corporation highlight his role as a key innovator in the industry. His advancements continue to shape the future of semiconductor devices.